X-ray diffraction and Raman scattering study of thermal-induced phase transformation in vertically aligned TiO2 nanocrystals grown on sapphire(1 0 0) via metal organic vapor deposition

Journal of Crystal Growth

Volumn 310, Issue 15, 2008, Pages 3663-3667

  Chen, C A ^a   Chen, K Y ^a   Huang, Y S ^a   Tsai, D S ^a   Tiong, K K ^b   Chien, F Z ^c  

^a NATIONAL TAIWAN UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Taiwan)

^b NATIONAL TAIWAN OCEAN UNIVERSITY   (Taiwan)

^c TAMKANG UNIVERSITY   (Taiwan)

Author keywords

A1. Nanostructures; A1. Raman scattering; A1. X ray diffraction; A3. Metal organic chemical vapor deposition; B1. Nanomaterials; B1. Oxides

Indexed keywords

MATHEMATICAL TRANSFORMATIONS; RAMAN SCATTERING;

DETAILED STUDY; INDUCED PHASE TRANSFORMATION; VERTICALLY ALIGNED; X RAY DIFFRACTION (XRD);

X RAY DIFFRACTION ANALYSIS;

EID: 46749094104     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jcrysgro.2008.05.021     Document Type: Article

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