Multilayer nano-particle image velocimetry (MnPIV) in microscale Poiseuille flows

Measurement Science and Technology

Volumn 19, Issue 7, 2008, Pages

  Li, H F ^a   Yoda, M ^a  

^a GEORGIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

Evanescent wave; Microfluidics; Particle image velocimetry; Poiseuille flow; Wall shear stress

Indexed keywords

CHANNEL FLOW; ELECTROMAGNETIC WAVE REFLECTION; FLOW VISUALIZATION; MICROFLUIDICS; MULTILAYERS; NANOPARTICLES; PRESSURE GRADIENT; REYNOLDS NUMBER; SHEAR STRESS; VELOCIMETERS; VELOCITY; VELOCITY MEASUREMENT;

EVANESCENT WAVE; EVANESCENT-WAVE ILLUMINATION; HYDRAULIC DIAMETER; MOLAR CONCENTRATION; PARTICLE IMAGE VELOCIMETRIES; POISEUILLE FLOW; TRAPEZOIDAL MICROCHANNELS; WALL SHEAR STRESS;

SHEAR FLOW;

EID: 46749089635     PISSN: 09570233     EISSN: 13616501     Source Type: Journal    
DOI: 10.1088/0957-0233/19/7/075402     Document Type: Article

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