Nanoelectronics: The strain of it all

Nature Nanotechnology

Volumn 3, Issue 7, 2008, Pages 381-382

  Ourmazd, Abbas ^a  

^a UNIVERSITY OF WISCONSIN MILWAUKEE   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

NANOTECHNOLOGY;

NANOSTRUCTURED MATERIALS;

INTERFEROMETRY; MOLECULAR ELECTRONICS; NANOTECHNOLOGY; PHYSICS; PRIORITY JOURNAL; SHORT SURVEY;

EID: 46749084267     PISSN: 17483387     EISSN: 17483395     Source Type: Journal    
DOI: 10.1038/nnano.2008.195     Document Type: Short Survey

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3. Hirsch, P., Howie, A., Nicholson, R., Pashley, D. W. & Whelan, M. J. Electron Microscopy of Thin Crystals (Krieger, Malabar, Florida, 1977).
4. Möllenstedt, G. & Düker, H. Z. für Physik A 145, 377-397 (1956).
5. Treacy, M. M. J. & Gibson, J. M. J. Vac. Sci. Technol. B 4, 1458-1466 (1986).