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Volumn 26, Issue 4, 2008, Pages 1027-1029
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Structural study of Ti O2 -based transparent conducting films
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Author keywords
[No Author keywords available]
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Indexed keywords
ELECTRON MICROSCOPES;
FILM GROWTH;
MICROSCOPES;
MOLECULAR BEAM EPITAXY;
NIOBIUM;
PROGRAMMABLE LOGIC CONTROLLERS;
PULSED LASER APPLICATIONS;
PULSED LASER DEPOSITION;
SPUTTERING;
SULFATE MINERALS;
TITANIUM DIOXIDE;
TITANIUM OXIDES;
ANATASE (TIO2);
DEPOSITED FILMS;
HIGHLY CONDUCTING;
MICROSCOPIC STRUCTURES;
POLARIZED OPTICAL MICROSCOPE (POM);
PULSED LASERS;
SMALL GRAINS;
STRUCTURAL STUDIES;
TRANSMISSION ELECTRON MICROSCOPE (TEM);
TRANSPARENT CONDUCTING FILMS;
CONDUCTIVE FILMS;
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EID: 46449124437
PISSN: 07342101
EISSN: None
Source Type: Journal
DOI: 10.1116/1.2944260 Document Type: Article |
Times cited : (11)
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References (8)
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