Evolutionary method for test frequencies selection based on entropy index and ambiguity sets

ICSES'06 - International Conference on Signals and Electronic Systems, Proceedings

Volumn , Issue , 2006, Pages 511-514

  Golonek, Tomasz ^a   Grzechca, Damian ^a   Rutkowski, Jerzy ^a  

^a SILESIAN UNIVERSITY OF TECHNOLOGY   (Poland)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONICS ENGINEERING; FIGHTER AIRCRAFT; SEMANTICS;

ANALOG TESTING; EVOLUTIONARY METHODS; FAULT DIAGNOSIS (FD); FAULT MASKING; TEST FREQUENCIES; TEST MEASUREMENTS;

TESTING;

EID: 46449114352     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (9)

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