The effects of high-pressure compression on transport and thermoelectric properties of TiS2 at low temperatures from 5 to 310 K

Journal of Applied Physics

Volumn 103, Issue 12, 2008, Pages

  Li, D ^a   Qin, X Y ^a   Li, H J ^a   Zhang, J ^a   Hoon, Hng Huey ^b  

^a INSTITUTE OF SOLID STATE PHYSICS   (China)

^b NANYANG TECHNOLOGICAL UNIVERSITY   (Singapore)

Author keywords

[No Author keywords available]

Indexed keywords

(PL) PROPERTIES; ELECTRICAL RESISTIVITIES; HIGH PRESSURE COMPRESSION; METALLIC STATES; ORDERS-OF-MAGNITUDE; TRANSITION (JEL CLASSIFICATIONS:E52 ,E41 ,E31);

EID: 46449113229     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2938748     Document Type: Article

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