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Volumn 793, Issue , 2003, Pages 295-304

Thermoelectric properties of TiS2 type materials

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALLINE MATERIALS; DOPING (ADDITIVES); ELECTRIC CONDUCTIVITY; ELECTRONIC PROPERTIES; IODINE; RATE CONSTANTS; THERMOELECTRICITY; THICKNESS CONTROL; VAN DER WAALS FORCES;

EID: 2442562462     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-793-s8.30     Document Type: Conference Paper
Times cited : (8)

References (14)
  • 4
    • 0035894355 scopus 로고    scopus 로고
    • H. Imai et al., Phys. Rev. B, 64, (2001) 241104
    • (2001) Phys. Rev. B , vol.64 , pp. 241104
    • Imai, H.1
  • 6
    • 0003580361 scopus 로고
    • Transition metal dichalcogenides
    • Preparation and Crystal Growth of Materials with Layered Structures; R. M. A. Lieth; D. Reidel: Boston, MA
    • R. M. A. Lieth and J. C. J. M. Terhell. Transition Metal Dichalcogenides. In Preparation and Crystal Growth of Materials with Layered Structures; R. M. A. Lieth; Physics and Chemistry of Materials with Layered Structures Vol. I; D. Reidel: Boston, MA, 1977
    • (1977) Physics and Chemistry of Materials with Layered Structures , vol.1
    • Lieth, R.M.A.1    Terhell, J.C.J.M.2
  • 10
    • 0004150157 scopus 로고
    • Release 4.11, Siemans Analytical X-Ray Instruments Inc., Madison WI
    • G. M. Sheldrick, SHELXTL-PLUS Crystallographic System, Release 4.11, Siemans Analytical X-Ray Instruments Inc., Madison WI, 1990
    • (1990) SHELXTL-pLUS Crystallographic System
    • Sheldrick, G.M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.