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Volumn 79, Issue 6, 2008, Pages

Transmissive x-ray beam position monitors with submicron position- and submillisecond time resolution

Author keywords

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Indexed keywords

DETECTORS;

EID: 46449112174     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2938400     Document Type: Article
Times cited : (14)

References (30)
  • 7
    • 46449108301 scopus 로고    scopus 로고
    • Micron Semiconductor Ltd., Lancing, UK, URL
    • Micron Semiconductor Ltd., Lancing, UK, URL: http://micronsemiconductor. co.uk
  • 11
    • 46449088247 scopus 로고    scopus 로고
    • ENZ Ingenieurbüro für Umweltelektronik & Automatisierung, Berlin, Germany, URL
    • ENZ Ingenieurbüro für Umweltelektronik & Automatisierung, Berlin, Germany, URL: http://www.enz-berlin.de
  • 15
    • 3142679897 scopus 로고    scopus 로고
    • (University of Colorado, Electrical and Computer Engineering Department, Boulder, CO); URL
    • B. van Zeghbroeck, Principles of Semiconductor Devices (University of Colorado, Electrical and Computer Engineering Department, Boulder, CO, 2006); URL: http://ece-www.colorado.edu/~bart/book/
    • (2006) Principles of Semiconductor Devices
    • Van Zeghbroeck, B.1
  • 16
    • 46449091524 scopus 로고    scopus 로고
    • TB 201, REFLEC, BESSY, Berlin, Germany.
    • F. Schäfers and M. Krumrey, TB 201, REFLEC, BESSY, Berlin, Germany, 1996.
    • (1996)
    • Schäfers, F.1    Krumrey, M.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.