Random left-censoring: A statistical approach accounting for detection limits in x-ray fluorescence analysis

X-Ray Spectrometry

Volumn 33, Issue 4, 2004, Pages 306-311

  Pajek, M ^a   Kubala Kukus A ^a   Banas D ^a   Braziewicz, J ^a   Majewska, U ^a  

^a JAN KOCHANOWSKI UNIVERSITY   (Poland)

Author keywords

[No Author keywords available]

Indexed keywords

FLUORESCENCE; INTELLIGENT SYSTEMS; MICROCHANNELS; MONTE CARLO METHODS;

CENSORED DATA; CONCENTRATION DISTRIBUTIONS; CONCENTRATION MEASUREMENT; DETECTION LIMITS; KAPLAN-MEIER; NELSON-AALEN ESTIMATOR; STATISTICAL APPROACH; TRACE ELEMENTS CONCENTRATION; X RAY FLUORESCENCE ANALYSIS; X RAY FLUORESCENCE TECHNIQUES;

TRACE ELEMENTS;

EID: 3242886222     PISSN: 00498246     EISSN: None     Source Type: Journal    
DOI: 10.1002/xrs.732     Document Type: Conference Paper

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