Comparison between optical techniques and confocal microscopy for defect detection on thin wires

Applied Surface Science

Volumn 238, Issue 1-4 SPEC. ISS., 2004, Pages 375-379

  Siegmann, Philip ^a,b   Sanchez Brea, Luis Miguel ^a   Martinez Anton, Juan Carlos ^a   Bernabeu, Eusebio ^a  

^a UNIVERSIDAD COMPLUTENSE DE MADRID   (Spain)

^b UNIVERSITY OF SHEFFIELD   (United Kingdom)

Author keywords

Metallic surfaces; Surface defects; Surface structures; Wires

Indexed keywords

ATOMIC FORCE MICROSCOPY; CAMERAS; CHARGE COUPLED DEVICES; DEFORMATION; LIGHT SCATTERING; SCANNING ELECTRON MICROSCOPY; SURFACE PHENOMENA;

CONFOCAL MICROSCOPY; DEFECT DETECTION; METALLIC WIRES; SURFACE STRUCTURES;

WIRE;

EID: 4644357523     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2004.05.240     Document Type: Conference Paper

References (8)

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