In-line detection and evaluation of surface defects on thin metallic wires

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4399, Issue , 2001, Pages 27-34

  Martinez Anton J C ^a   Siegmann, P ^a   Sanchez Brea, L M ^a   Bernabeu, E ^a   Gomez Pedrero J A ^a   Canabal, H ^a  

^a UNIVERSIDAD COMPLUTENSE DE MADRID   (Spain)

Author keywords

Conical reflection; Quality control; Wire

Indexed keywords

CHARGE COUPLED DEVICES; DEFECTS; DIFFRACTION GRATINGS; LASER BEAMS; LIGHT REFLECTION; METALS; QUALITY CONTROL;

SURFACE DEFECTS;

WIRE;

EID: 0035758285     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.445586     Document Type: Conference Paper

References (6)

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