Local resistivity as an evaluation tool for thickness dependence of critical current density in YBa2Cu3O7-x coated conductors

Physica C: Superconductivity and its Applications

Volumn 412-414, Issue SPEC. ISS., 2004, Pages 1030-1035

  Jo, W ^a   Hammond, R H ^b   Beasley, M R ^b  

^a Ewha Womans University   (South Korea)

^b STANFORD UNIVERSITY   (United States)

Author keywords

Coated conductor; Critical current density; Thickness dependence

Indexed keywords

COATED MATERIALS; ELECTRIC CONDUCTIVITY; ELECTRIC CONDUCTORS; FILM GROWTH; HIGH TEMPERATURE SUPERCONDUCTORS; OPTIMIZATION; SUPERCONDUCTING TRANSITION TEMPERATURE; THICKNESS CONTROL; THIN FILMS; TRANSPORT PROPERTIES; YTTRIUM BARIUM COPPER OXIDES;

COATED CONDUCTORS; CURRENT CARRYING CAPACITY; TEMPERATURE DEPENDENCE; THICKNESS DEPENDENCE;

CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY);

EID: 4644341712     PISSN: 09214534     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.physc.2004.01.125     Document Type: Conference Paper

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