Spectroscopic application of long-wavelength (< 2 μm) VCSEL diode lasers;Spektroskopischer einsatz neuer langwelliger (bis 2 μm) diodenlaser (VCSEL) für schwierige bedingungen

Technisches Messen

Volumn 70, Issue 6, 2003, Pages 294-305

  Lackner, Maximilian ^a   Winter, Franz ^b   Totschnig, Gerhard ^b   Ortsiefer, Markus ^c   Rosskopf, Jùrgen ^c   Amann, Markus Christian ^d,e   Shau, Robert ^d,e  

^a ProcessEng Engineering GmbH   (Austria)

^b VIENNA UNIVERSITY OF TECHNOLOGY   (Austria)

^c VERTILAS GMBH   (Germany)

^d TECHNICAL UNIVERSITY OF MUNICH   (Germany)

^e WALTER SCHOTTKY INSTITUT   (Germany)

Author keywords

Absorption spectroscopy; Diode laser; Gas analysis; High pressure; In situ; VCSEL

Indexed keywords

HIGH PRESSURE; HIGH-RESOLUTION SPECTRA; NEAR-INFRARED SPECTRAL REGIONS; SPECTROSCOPIC APPLICATION; TUNABLE DIODE LASER SPECTROSCOPY; VERTICAL-CAVITY SURFACE EMITTING LASER; WAVELENGTH MODULATION; WAVELENGTH TUNABILITY;

ABSORPTION SPECTROSCOPY; ATMOSPHERIC PRESSURE; DISTRIBUTED FEEDBACK LASERS; GAS FUEL ANALYSIS; LASER SPECTROSCOPY; METHANE; MOLECULAR SPECTROSCOPY; SPECTROMETERS; SURFACE EMITTING LASERS; WAVELENGTH;

SEMICONDUCTOR LASERS;

EID: 4644336588     PISSN: 01718096     EISSN: 01718096     Source Type: Journal    
DOI: 10.1524/teme.70.6.294.20042     Document Type: Review

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