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Volumn 68, Issue 9, 2001, Pages 415-423

Diode Laser Spectroscopy for Gas Analysis in Industrial Environments;Einsatz von Diodenlaserspektroskopie für die industrielle Gasmesstechnik

Author keywords

[No Author keywords available]

Indexed keywords

DETECTION SCHEME; INDUSTRIAL ENVIRONMENTS; MEASUREMENT SYSTEM; NEAR INFRARED SPECTRAL; OPEN-PATH;

EID: 0042833011     PISSN: 01718096     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (3)

References (5)
  • 1
    • 84876624936 scopus 로고    scopus 로고
    • Produktbeschreibung "Polytron ToxLine FT-UV Open-Path Detektor" der Fa. Drägerwerk AG, Lübeck
    • Produktbeschreibung "Polytron ToxLine FT-UV Open-Path Detektor" der Fa. Drägerwerk AG, Lübeck.
  • 2
    • 0019635267 scopus 로고
    • Second-harmonic Detection with Tunable Diode Lasers - Comparison of Experiment and Theory
    • J. Reid, D. Labrie, "Second-Harmonic Detection with Tunable Diode Lasers - Comparison of Experiment and Theory", Appl. Phys. B 26, 203-210 (1981).
    • (1981) Appl. Phys. b , vol.26 , pp. 203-210
    • Reid, J.1    Labrie, D.2
  • 4
    • 84876627642 scopus 로고    scopus 로고
    • Spektraldatenbank "HITRAN 96"
    • Harvard-Smithsonian Center for Astrophysics
    • L. S. Rothman, Spektraldatenbank "HITRAN 96", Atomic and Molecular Physics Division, Harvard-Smithsonian Center for Astrophysics.
    • Atomic and Molecular Physics Division
    • Rothman, L.S.1
  • 5
    • 84876642173 scopus 로고    scopus 로고
    • Sinclair Optics, Inc., OSLO 6.04
    • Sinclair Optics, Inc., OSLO 6.04.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.