Simultaneous switching noise in IBIS models

IEEE International Symposium on Electromagnetic Compatibility

Volumn 3, Issue , 2004, Pages 1000-1004

  Varma, Ambrish ^a   Lipa, Steve ^a   Glaser, Alan ^a   Steer, Michael ^a   Franzon, Paul ^a  

^a NORTH CAROLINA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS DRIVER CIRCUITS; FINITE TIME DIFFERENCE APPROXIMATION; INPUT/OUTPUT BUFFER INFORMATION SPECIFICATION (IBIS); SWITCHING NOISES;

APPROXIMATION THEORY; CMOS INTEGRATED CIRCUITS; COMPUTER SIMULATION; ELECTRIC GROUNDING; ELECTRIC POTENTIAL; FINITE DIFFERENCE METHOD; MATHEMATICAL MODELS; PRODUCT DESIGN; SPURIOUS SIGNAL NOISE; SWITCHING NETWORKS; TIME DOMAIN ANALYSIS; TRANSISTORS;

BUFFER CIRCUITS;

EID: 4644318488     PISSN: 10774076     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (6)

1. Introduction to IBIS Models, Arpad Muranyi, IBIS Model Training, San Jose, California - April 26, 2000
2. An Experimental Procedure to Derive Reliable IBIS Models, Zak, T.; Ducrot, M.; Xavier, C.; Drissi, M.; Electronics Packaging Technology Conference, 2000. (EPTC 2000). Proceedings of 3rd, 5-7 Dec 2000.
3. Macro-Modeling of Non-Linear I/O Drivers using Spline Functions and Finite Time Difference Approximation. Bhyrav Mutnury, Madhavan Swaminathan and Jim Libous, 12th Tropical Meeting on Electrical Performance of Electronic Packaging (EPEP 2003), Princeton, New Jersey, October, 2003.
4. Avanti, Star-HSpice manual Release 2001.2, chapter 9.
5. Adding On-Chip Capacitance in IBIS Format for SSO Simulations. Raymond Y. Chen DesignCon 2004 - IBIS Summit.
6. Simultaneous Switching Noise of CMOS Devices and Systems. Ramesh Senthinathan and John L. Prince. Kluwer Academic Publishers, 1994.