Characterization of a bit-wise volumetric storage medium for a space environment

Optics Express

Volumn 12, Issue 12, 2004, Pages 2662-2669

  Zhang, Y ^a   Butz, J ^b   Curtis, J ^b   Beaudry, N ^b   Bletscher, W L ^b   Erwin, K J ^b   Knight, D ^b   Milster, T D ^b   Walker, E ^c  

^a INDIANA UNIVERSITY   (United States)

^b UNIVERSITY OF ARIZONA   (United States)

^c Call Recall Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BIT ERROR RATE; COMPUTER SIMULATION; FAILURE ANALYSIS; HOLOGRAPHY; LIGHT; LIGHT ABSORPTION; MULTILAYERS; PHOTOCHROMISM; RADIATION EFFECTS; SENSITIVITY ANALYSIS; THERMAL EFFECTS;

BIT-WISE STORAGE; DISK FAILURE; PROTON-DOSE CONDITIONS; SPACE ENVIRONMENT;

OPTICAL DATA STORAGE;

EID: 4644308503     PISSN: 10944087     EISSN: None     Source Type: Journal    
DOI: 10.1364/OPEX.12.002662     Document Type: Article

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