Stability of scanning tunneling microscopy tip-induced bimetallic nanoclusters: Influence of hardness and composition on the cohesive energies

Journal of Physical Chemistry B

Volumn 108, Issue 37, 2004, Pages 13944-13947

  Harinipriya, S ^a   Sangaranarayanan, M V ^a  

^a INDIAN INSTITUTE OF TECHNOLOGY MADRAS   (India)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL REACTIONS; COMPOSITION; COPPER; ELECTROCHEMISTRY; GOLD; HARDNESS; MONOLAYERS; PROBABILITY DENSITY FUNCTION; SCANNING TUNNELING MICROSCOPY; THERMODYNAMIC STABILITY;

CATALYTIC PROCESSES; COHESIVE ENERGIES; LOCAL DENSITY APPROXIMATIONS; NANOCLUSTERS;

NANOSTRUCTURED MATERIALS;

EID: 4644280722     PISSN: 15206106     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp0368942     Document Type: Article

References (39)

1. Antonietti, M.; Goltner, C. Adv. Mater. 1998, 10, 195.
2. Spatz., J. P.; Roescher, A.; Mw, M. Angew. Chem., Int. Ed. Engl. 1997, 36, 910.
3. Ghosh, K.; Maiti, S. N. J. Appl. Polym. Sci. 1996, 60, 323.
4. See, for example: Zhao, W.-B.; Zhu, J.-J.; Chen, H.-Y. J. Cryst. Growth 2003, 258, 176 and references therein.
5. Li, W.; Virtanen, J. A.; Penner, R. M. Appl. Phys. Lett. 1992, 60, 1181.
6. Li, W.; Virtanen, J. A.; Penner, R. M. J. Phys. Chem. 1992, 96, 6529.
7. Schultze, J. W. Electrochim. Acta 1997, 42, 2981.
8. Ertl, G. Electrochim. Acta 1998, 43, 2743.
9. Kolb, D. M.; Engelmann, G. E.; Ziegler, J. C. Angew. Chem. 2000, 112, 1166.
10. Kolb, D. M.; Engelmann, G. E.; Ziegler, J. C. Angew. Chem., Int. Ed. 2000, 39, 1123.
11. Otero, R.; Vazquez de Parga, A. L.; Miranda, R. Surf. Sci. 2000, 447, 143.
12. Chang, Q. S.; Wang, Y.; Tay, B. K.; Li, S.; Huang, H.; Zhang, Y. B. J. Phys. Chem. B 2002, 106, 10701.
13. Kolb, D. M.; Ullmann, R.; Ziegler, J. C. Electrochim. Acta 1998, 43, 2751.
14. Dietterle, M.; Will, T.; Kolb, D. M. Surf. Sci. 1995, 342, 29.
15. Engelmann, G. E.; Ziegler, J. C.; Kolb, D. M. Surf. Sci. Lett. 1998, 401, L420.
16. Kuipers, L.; Hoogeman, M. S.; Frenken, J. W. M. Surf. Sci. 1995, 340, 231.
17. Del Popolo, M. G.; Leiva, E. P. M.; Schmickler, W. Angew. Chem., Int. Ed. 2001, 40, 4674.
18. Kolb, D. M. In Advances in Electrochemistry and Electrochemical Engineering; Gerischer, H., Tobias, Ch. W., Eds.; Wiley: New York, 1978; Vol. 11, p 125.
19. Sudha, V.; Sangaranarayanan, M. V. J. Phys. Chem. B 2002, 106, 2699.
20. Sudha, V.; Sangaranarayanan, M. V. J. Phys. Chem B 2003, 107, 3907.
21. Barnett, R. N.; Cleveland, C. L.; Häkkinen, H.; Luedtke, W. D.; Yannouleas, C.; Landman, U. Eur. J. Phys. D 1999, 9, 95.
22. Qi, W. H.; Wang, M. P.; Xu, G. Y.; Li, Z.; Chen, J. Y. China - EU Forum on Nanosized Technology 2002, 86.
23. Parr, R. G.; Yang, W. Density Functional Theory of Atoms and Molecules; Oxford University Press: New York, 1989; p 96 and references therein.
24. Chattaraj, P. K.; Fuentealba, P.; Jaque, P.; Toro-Labbe, A. J. Phys. Chem. A 1999, 100, 9307.
25. Ghanty, T. K.; Ghosh, S. K. J. Phys. Chem. 1996, 100, 12295.
26. Hohm, U. J. Phys. Chem. A 2000, 104, 8418 and references therein.
27. Harinipriya, S.; Sangaranarayanan, M. V. J. Chem. Phys. 2002, 117, 8959.
28. Pearson, R. G. Inorg. Chem. 1988, 27, 734.
29. Lide, D. R. CRC Handbook of Chemistry and Physics, 68th ed.; CRC Press Inc.: Florida, 1987.
30. www.fysik.dtu.dk/~skiver/surface/surfaces.html.
31. See, for example: Atomic and Nanometer-Scale Modification of Materials: Fundamentals and Applications; Avouris, P., Ed.; Kluwer Academic Publishers: 1993; NATO ASI Vol. E239.
32. Mamin, H. J.; Chiang, S.; Birk, H.; Guethner, P. H.; Rugar, D. J. Vac. Sci. Technol. 1991, B9, 1398.
33. Eigler, D. M.; Schwiezer, E. K. Nature 1990, 344, 524.
34. Crommie, M. F.; Lutz, C. P.; Eigler, D. M. Science 1992, 262, 218.
35. Meyer, G.; Bartels, L.; Zophel, S.; Henze, E.; Rieder, K. H. Phys. Rev. Lett. 1997, 78, 1512.
36. Landmann, U.; Luedtke, W. D. In Scanning Tunneling Microscopy, "Consequences of Tip - Sample Interactions"; Wiesendanger, R., Guntherodt, H. J., Eds.; Springer: Berlin, 1993.
37. Landmann, U.; Luedtke, W. D.; Burnham, N. A.; Colton, R. J. Science 1990, 248, 454.
38. Kolb, D. M.; Ullmann, R.; Will, T. Science 1997, 275, 1097.
39. Del Popolo, M. G.; Leiva, E. P. M.; Mariscal, M.; Schmickler, W. Nanotechnology 2003, 14, 1009.