Synthesis, crystal structure, and anisotropic thermal expansion of Dy4.67(SiO4)3O

Journal of Materials Research

Volumn 19, Issue 8, 2004, Pages 2330-2335

  Misture, S T ^a   Harvey, S P ^a   Francy, R T ^a   Gao, Y ^b   DeCarr, S ^b   Bancheri, S C ^b  

^a ALFRED UNIVERSITY   (United States)

^b GE GLOBAL RESEARCH   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANISOTROPY; CRYSTAL STRUCTURE; SINGLE CRYSTALS; SYNCHROTRON RADIATION; SYNTHESIS (CHEMICAL); THERMAL EXPANSION; X RAY POWDER DIFFRACTION;

ANISOTROPIC THERMAL EXPANSION; MIXED OXIDE METHOD; RIETVELD METHOD; SINGLE CRYSTAL DIFFRACTION;

DYSPROSIUM COMPOUNDS;

EID: 4644268703     PISSN: 08842914     EISSN: None     Source Type: Journal    
DOI: 10.1557/JMR.2004.0294     Document Type: Article

References (27)

1. J.J. Chambers and G.N. Parsons: J. Appl. Phys. 90, 918 (2001).
2. G.D. Wilk, R.M. Wallace, and J.M. Anthony: J. Appl. Phys. 87, 484 (2000).
3. Q.Y. Zhang, K. Pita, S. Buddhudu, and C.H. Kam: J. Phys. D: Appl. Phys. 35, 3085 (2002).
4. P.J. Marsh, J. Silver, A. Vecht, and A. Newport: J. Lumin. 97, 229 (2002).
5. J.W. Nowok, J.P. Kay, and R.J. Kulas: J. Mater. Res. 16, 2251 (2001).
6. S. Kamal, P.V. Saodekar, and S.S. Bhoga: Bull. Mater. Sci. 21, 469 (1998).
7. K. Masayiki, O. Yuzura, and M. Tatsuo: J. Jpn. Inst. Metals 63, 661 (1999).
8. M. Kato, T. Fukasawa, and Y. Goto: J. Ceram. Soc. Jpn. 108, 861 (2O0O).
9. R. Wills, J.A. Cunningham, J.M. Wimmer, and R.W. Stewart: J. Am. Ceram. Soc. 59, 269 (1976).
10. E.L. Belokoneva, T.L. Petrova, M.A. Simonov, and N.V. Belov: Kristallografiya 17, 490 (1972).
11. Yu.I. Smolin and Yu.F. Shepelev: Izvestiya Adademii Nauk SSSR Neogranicheskie Materialy. 5, 1823 (1969).
12. E.A. Kuz'min and A.N.V. Belov: Doklady Adademii Nauk SSSR. 165, 88 (1965).
13. Inorganic Crystal Structure Database, Version 1.20 (Fachinformationszentrum Karlsruhe, Germany, and the U.S. Department of Commerce, February 2003).
14. Diffrac Plus, Topas, Bruker AXS GmbH, Karlsruhe, Germany.
15. SAINT, Program to Integrate and Reduce Raw Crystallographic Area Detector Data (Siemens Analytical X-ray Instruments Inc., Madison, WI, 1996).
16. R.H.J. Blessing: J. Appl. Crystallogr. 30, 421 (1997).
17. G.M. Sheldrick: SHELXL97. Program for Crystal Structure Refinement (University of Göttingen, Göttingen, Germany, 1997).
18. S.T. Misture: Meas. Sci. Technol. 14, 1091 (2003).
19. Thermal Expansion, Thermophysical Properties of Matter, Vol. 12, edited by Y.S. Touloukian, R.K. Kirby, R.E. Taylor, and P.D. Desai (IFI/Plenum, New York, 1977), pp. 176-193.
20. G.S. Pawley: J. Appl. Crystallogr. 14, 357 (1981).
21. U. Kolitsch, H.J. Seifert, and F. Aldinger: J. Phase Equil. 19(5), 426 (1998).
22. M. Aparicio and A. Duran: J. Am. Ceram. Soc. 80, 1351 (2000).
23. J. Felsche: J. Solid State Chem. 5, 266 (1972).
24. International Centre for Diffraction Data PDF-2 (Newtown Square, PA, 2003).
25. K. Fukuda and H. Matsubara: J. Mater. Res. 18, 1715 (2003).
26. S. Nakayama, M. Sakamoto, M. Higuchi, K. Kodaira, M. Sato, S. Kakita, T. Suzuki, and K. Itoh: J. Eur. Ceram. Soc. 19(4), 507 (1999).
27. J.E.H. Sansom, D. Richings, and P.R. Slater: Solid State Ionics 139, 205 (2001).