Optical properties and microstructure of CeO2-SiO2 composite thin films

Thin Solid Films

Volumn 468, Issue 1-2, 2004, Pages 28-31

  Koo, Won Hoe ^a   Jeoung, Soon Moon ^a   Choi, Sang Hun ^a   Jo, Sung Jin ^a   Baik, Hong Koo ^a   Lee, Se Jong ^b   Song, Kie Moon ^c  

^a Yonsei University   (South Korea)

^b Kyungsung University   (South Korea)

^c Konkuk University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS MATERIALS; ATOMIC FORCE MICROSCOPY; CERIUM COMPOUNDS; COMPOSITE MATERIALS; ION BEAM ASSISTED DEPOSITION; MICROSTRUCTURE; OPTICAL PROPERTIES; REFRACTIVE INDEX; SCANNING ELECTRON MICROSCOPY; SILICA; SURFACE ROUGHNESS; X RAY DIFFRACTION ANALYSIS;

AMORPHOUS SURFACE; COEVAPORATION; COMPOSITE THIN FILMS; GRANULAR STRUCTURE;

THIN FILMS;

EID: 4644268518     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2004.03.042     Document Type: Article

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