Imaging of carrier-envelope phase effects in above-threshold ionization with intense few-cycle laser fields

New Journal of Physics

Volumn 10, Issue , 2008, Pages

  Kling, M F ^a,b   Rauschenberger, J ^b,c   Verhoef, A J ^b   Hasovic E ^d   Uphues, T ^b   Milosevic D B ^d,e   Muller, H G ^a   Vrakking, M J J ^a  

^a FOM INSTITUTE AMOLF   (Netherlands)

^b MAX PLANCK INSTITUT FÜR QUANTENOPTIK   (Germany)

^c UNIVERSITY OF MUNICH   (Germany)

^d UNIVERSITY OF SARAJEVO   (Bosnia and Herzegovina)

^e MAX BORN INSTITUT   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ANGULAR DISTRIBUTION; ARGON; CIVIL AVIATION; ELECTRON EMISSION; EMISSION CONTROL; IMAGING TECHNIQUES; INERT GASES; IONIZATION; IONIZATION OF GASES; KRYPTON; LASERS; NONMETALS; PULSED LASER DEPOSITION; XENON;

ABOVE THRESHOLD IONIZATION (ATI); ANGULAR RESOLUTIONS; CARRIER-ENVELOPE PHASE (CEP) EFFECTS; CARRIER-ENVELOPE-PHASE (CEP); DINGER EQUATION; EXPERIMENTAL DATA; FEMTO SECONDS; FEW CYCLES; INTENSE (CO); LASER FIELDS; SINGLE SHOT (SS); STRONG FIELD APPROXIMATION (SFA); TIME-DEPENDENT; VELOCITY-MAP IMAGING;

LASER OPTICS;

EID: 46249092156     PISSN: 13672630     EISSN: None     Source Type: Journal    
DOI: 10.1088/1367-2630/10/2/025024     Document Type: Article

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