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Volumn 17, Issue 4, 2007, Pages 376-389

Simulation of above-threshold ionization experiments using the strong-field approximation

Author keywords

[No Author keywords available]

Indexed keywords

ANGULAR DISTRIBUTION; COMPUTER SIMULATION; ELECTRON EMISSION; HELIUM; NEON; PHOTOELECTRONS;

EID: 34247181081     PISSN: 1054660X     EISSN: 15556611     Source Type: Journal    
DOI: 10.1134/S1054660X07040135     Document Type: Article
Times cited : (68)

References (60)
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    • Laser Phys. 15, 268 (2005);
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  • 25
    • 34247247551 scopus 로고    scopus 로고
    • A. Čerkić, Electron-Atom Scattering in the Presence of a Strong Laser Field (in Bosnian), M. Se. Thesis (Univ. of Tuzla, Tuzla, 2005).
    • A. Čerkić, Electron-Atom Scattering in the Presence of a Strong Laser Field (in Bosnian), M. Se. Thesis (Univ. of Tuzla, Tuzla, 2005).
  • 29
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    • A. Gazibegović-Busuladžić, Above-Threshold Detachment of Negative Ions in a Strong Laser Field (in Bosnian), M. Sc. Thesis (University of Tuzla, Tuzla, 2005).
    • A. Gazibegović-Busuladžić, Above-Threshold Detachment of Negative Ions in a Strong Laser Field (in Bosnian), M. Sc. Thesis (University of Tuzla, Tuzla, 2005).
  • 42
    • 0009367757 scopus 로고    scopus 로고
    • J. Phys. B 32, 1585 (1999).
    • (1999) J. Phys. B , vol.32 , pp. 1585
  • 51
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    • J
    • [JETP Lett. 83, 536 (2006)];
    • (2006) , vol.83 , Issue.536
    • Lett, E.T.P.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.