Rigorous sufficient conditions for index-guided modes in microstructured dielectric waveguides

Optics Express

Volumn 16, Issue 13, 2008, Pages 9261-9275

  Lee, Karen K Y ^a   Avniel, Yehuda ^a   Johnson, Steven G ^a  

^a MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTERIZED TOMOGRAPHY; DIELECTRIC MATERIALS; DIELECTRIC WAVEGUIDES; GUIDED ELECTROMAGNETIC WAVE PROPAGATION; PHOTONIC CRYSTAL FIBERS; QUANTUM THEORY; REFRACTIVE INDEX; WAVEGUIDES;

ANISOTROPIC MATERIAL; GENERAL CLASS; GUIDED MODES; INDEX OF REFRACTION; PROPAGATION DIRECTION; VARIATIONAL METHODS;

HOLEY FIBERS;

ARTICLE; COMPUTER SIMULATION; EQUIPMENT; EQUIPMENT DESIGN; LIGHT; METHODOLOGY; RADIATION SCATTERING; REFRACTOMETRY; THEORETICAL MODEL;

COMPUTER SIMULATION; EQUIPMENT DESIGN; EQUIPMENT FAILURE ANALYSIS; LIGHT; MODELS, THEORETICAL; REFRACTOMETRY; SCATTERING, RADIATION;

EID: 46149125956     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.16.009261     Document Type: Article

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