Electrical contact resistance of bismuth telluride nanowires

International Conference on Thermoelectrics, ICT, Proceedings

Volumn , Issue , 2006, Pages 693-696

  Jones, P ^b   Huber, T E ^a   Melngailis, J ^b   Barry, J ^b   Ervin, M H ^b   Zheleva, T S ^b   Nikolaeva, A ^b   Konopko, Leonid ^b   Graf, M ^b  

^a HOWARD UNIVERSITY   (United States)

^b NONE

Author keywords

[No Author keywords available]

Indexed keywords

(P ,P ,T) MEASUREMENTS; (PL) PROPERTIES; ALUMINA TEMPLATES; BISMUTH TELLURIDES; BUILDING BLOCKS; DENSE ARRAYS; DEVICE PERFORMANCES; ELECTRICAL CONTACT RESISTANCE (ECR); ELECTRICAL CONTACTS; HEAT MANAGEMENT; INDIVIDUAL (PSS 544-7); INTERNATIONAL CONFERENCES; METAL ELECTRODES; MOLTEN BISMUTH; NANO SCALING; NANO WIRES; NEW APPLICATIONS; NON EQUILIBRIUM; NON LITHOGRAPHIC FABRICATION; PLANAR ELECTRODES; PRESSURE INJECTION; ROOM-TEMPERATURE (RT); TWO-STEP METHODS; UNCOOLED;

BISMUTH; BISMUTH COMPOUNDS; CONTACT RESISTANCE; CONTACTS (FLUID MECHANICS); ELECTRIC CONTACTS; ELECTRIC WIRE; ELECTRODES; GOLD; HEALTH; LEAD; MATERIALS PROPERTIES; METALLIZING; METALS; MICROELECTRONICS; NANOSTRUCTURES; NANOTECHNOLOGY; NANOWIRES; OPTICAL DESIGN; ORE TREATMENT; TELLURIUM COMPOUNDS; THERMOELECTRIC EQUIPMENT; THERMOELECTRICITY;

NANOSTRUCTURED MATERIALS;

EID: 46149109076     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICT.2006.331236     Document Type: Conference Paper

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