Study of oxidized Cu(1 1 0) surface using noncontact atomic force microscopy

Surface Science

Volumn 602, Issue 13, 2008, Pages 2175-2182

  Kishimoto, Shohei ^a   Kageshima, Masami ^a   Naitoh, Yoshitaka ^a   Li, Yan Jun ^a   Sugawara, Yasuhiro ^a  

^a OSAKA UNIVERSITY   (Japan)

Author keywords

Atomic force microscopy; Copper; Insulating surfaces; morphology, roughness, and topography; Oxidation; Oxides; Oxygen; Surface relaxation and reconstruction; Surface structure

Indexed keywords

ATOMIC FORCE MICROSCOPY; ATOMIC PHYSICS; ATOMS; COPPER ALLOYS; MICROFLUIDICS; MICROSCOPES; MICROSCOPIC EXAMINATION; SCANNING PROBE MICROSCOPY; SURFACES;

CU(1 1 0); NON-CONTACT ATOMIC FORCE MICROSCOPY (NC-AFM); OXIDATION TEMPERATURES;

IMAGING TECHNIQUES;

EID: 45849148062     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2008.04.030     Document Type: Article

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