Large-scale synthesis and characterization of hexagonal prism-shaped SiC nanowires

Journal of Nanoscience and Nanotechnology

Volumn 8, Issue 4, 2008, Pages 2151-2156

  Chen, Jianjun ^a,b   Yang, Guangyi ^a   Wu, Renbing ^a   Pan, Yi ^a   Lin, Jing ^a   Zhai, Rui ^a   Wu, Lingling ^a  

^a ZHEJIANG UNIVERSITY   (China)

^b ZHEJIANG SCI TECH UNIVERSITY   (China)

Author keywords

Crystal growth; Nanowires; Raman spectroscopy; Silicon carbide; Vapor solid growth mechanism

Indexed keywords

(100) SILICON; ELECTRON MICROSCOPY (TEM AND SEM); FORMATION MECHANISMS; FOURIER; GRAPHITE CRUCIBLES; GRAPHITE SUBSTRATES; GROWTH MECHANISMS; HEXAGONAL CROSS SECTIONS; HEXAGONAL PRISMS; HIGH MAGNIFICATION; INFRARED (IR); LARGE-SCALE SYNTHESIS; SELECTED AREA ELECTRON DIFFRACTION (SAED); SIC NANOWIRES; SURFACE ENERGIES; VAPOR-SOLID (VS); X RAY DIFFRACTION (XRD);

ARCHITECTURAL ACOUSTICS; AUGER ELECTRON SPECTROSCOPY; CARBON; DIFFRACTION; ELECTRIC WIRE; ELECTRON MICROSCOPY; GRAPHITE; INFRARED SPECTROSCOPY; IRIDIUM; MECHANISMS; NANOSTRUCTURED MATERIALS; NANOSTRUCTURES; NANOWIRES; PRISMS; SCANNING; SILICON CARBIDE; SPECTROSCOPIC ANALYSIS; SPECTRUM ANALYSIS; SURFACE CHEMISTRY; SURFACE TENSION; TRANSMISSION ELECTRON MICROSCOPY; X RAY ANALYSIS;

X RAY DIFFRACTION ANALYSIS;

INORGANIC COMPOUND; NANOMATERIAL; SILICON CARBIDE; SILICON DERIVATIVE;

ARTICLE; CHEMISTRY; CONFORMATION; CRYSTALLIZATION; MACROMOLECULE; MATERIALS TESTING; METHODOLOGY; NANOTECHNOLOGY; PARTICLE SIZE; SURFACE PROPERTY; ULTRASTRUCTURE;

CARBON COMPOUNDS, INORGANIC; CRYSTALLIZATION; MACROMOLECULAR SUBSTANCES; MATERIALS TESTING; MOLECULAR CONFORMATION; NANOSTRUCTURES; NANOTECHNOLOGY; PARTICLE SIZE; SILICON COMPOUNDS; SURFACE PROPERTIES;

EID: 45849144052     PISSN: 15334880     EISSN: None     Source Type: Journal    
DOI: 10.1166/jnn.2008.070     Document Type: Article

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