Structure and ultrafast carrier dynamics in n-type transparent Mo:ZnO nanocrystalline thin films

Applied Physics A: Materials Science and Processing

Volumn 92, Issue 2, 2008, Pages 357-360

  Shi, Jielong ^a   Ma, Hong ^a   Ma, Guohong ^a   Ma, Hongliang ^a   Shen, Jie ^b  

^a SHANGHAI UNIVERSITY   (China)

^b FUDAN UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

CIVIL AVIATION; COATINGS; DECAY (ORGANIC); METALLIC FILMS; MICROFLUIDICS; MOLYBDENUM; SEMICONDUCTING ZINC COMPOUNDS; SOLIDS; THICK FILMS; THIN FILMS; X RAY DIFFRACTION ANALYSIS; ZINC ALLOYS; ZINC OXIDE;

(E ,3E) PROCESS; BIEXPONENTIAL DECAYS; DC SPUTTERING; EXPONENTIAL DECAYS; FEMTO SECONDS; HIGH QUALITY (HQ); N-TYPE SEMICONDUCTORS; NANO CRYSTALLINE THIN FILMS; PURE ZNO; SPRINGER (CO); TWO-COLOR; ULTRA-FAST; ULTRAFAST CARRIER DYNAMICS; ZNO FILMS; ZNO LATTICE; ZNO THIN FILMS;

CHARGE CARRIERS;

EID: 45849110653     PISSN: 09478396     EISSN: 14320630     Source Type: Journal    
DOI: 10.1007/s00339-008-4529-8     Document Type: Article

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