Thermal annealing effect on structural and electrical properties of chemical bath-deposited CdS films

Thin Solid Films

Volumn 516, Issue 20, 2008, Pages 7008-7012

  Hiie, J ^a   Muska, K ^a   Valdna, V ^a   Mikli, V ^a   Taklaja, A ^a   Gavrilov, A ^a  

^a TALLINN UNIVERSITY OF TECHNOLOGY   (Estonia)

Author keywords

Annealing; Cadmium chloride; Cadmium sulphide; Resistivity; Structural properties

Indexed keywords

ANNEALING; ATOMIC FORCE MICROSCOPY; ATOMIC SPECTROSCOPY; AUGER ELECTRON SPECTROSCOPY; CADMIUM COMPOUNDS; CHEMICAL PROPERTIES; ELECTRIC PROPERTIES; ELECTRON MICROSCOPES; ELECTRON MICROSCOPY; ELECTRON OPTICS; ENERGY RESOURCES; IMAGING TECHNIQUES; MICROSCOPES; SCANNING; SCANNING ELECTRON MICROSCOPY; SCANNING PROBE MICROSCOPY; STRUCTURAL PROPERTIES; X RAY ANALYSIS; X RAY DIFFRACTION ANALYSIS; X RAY FILMS; X RAY SPECTROSCOPY;

ANNEALING EFFECTS; ATOMIC FORCE MICROSCOPY (AFM); CDS FILMS; CHEMICAL BATHS; ELECTRICAL (ELECTRONIC) PROPERTIES; ELECTRON MICROSCOPY (TEM AND SEM); ENERGY DISPERSIVE; X RAY DIFFRACTION (XRD);

MICROSCOPIC EXAMINATION;

EID: 45849101715     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2007.12.008     Document Type: Article

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