Self-assembled monolayers of benzylmercaptan and p-cyanobenzylmercaptan on au(111) surfaces: Structural and spectroscopic characterization

Langmuir

Volumn 24, Issue 11, 2008, Pages 5726-5733

  Hallmann, L ^a   Bashir, A ^b   Strunskus, T ^a,b   Adelung, R ^a   Staemmler, V ^b   Woll Ch ^b   Tuczek, F ^a  

^a UNIVERSITY OF KIEL   (Germany)

^b RUHR UNIVERSITY BOCHUM   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION; ABSORPTION SPECTROSCOPY; ADSORPTION; CALCULATIONS; CUBIC BORON NITRIDE; DYES; ELECTRON ENERGY LEVELS; ELECTRON TUNNELING; FILM GROWTH; GOLD ALLOYS; IMAGING TECHNIQUES; METAL COMPLEXES; METALLIC COMPOUNDS; MICROFLUIDICS; MICROSCOPIC EXAMINATION; MOLECULAR ORBITALS; MOLECULAR SPECTROSCOPY; MOLECULAR STRUCTURE; MOLECULES; MONOLAYERS; PHASE SEPARATION; PHOTOELECTRON SPECTROSCOPY; SCANNING; SCANNING PROBE MICROSCOPY; SCANNING TUNNELING MICROSCOPY; SELF ASSEMBLED MONOLAYERS; SEPARATION; SPECTROSCOPIC ANALYSIS; SPECTRUM ANALYSIS; SURFACE PROPERTIES; SURFACES; TRANSITION METALS; X RAY SPECTROSCOPY; X RAYS;

(1 1 0) SURFACE; AB INITIO CALCULATIONS; AMERICAN CHEMICAL SOCIETY (ACS); AU(111) SURFACES; COVALENT ATTACHMENTS; FUNCTIONALIZED SURFACES; HEXAGONAL STRUCTURES; NEAR-EDGE X-RAY ABSORPTION FINE STRUCTURE (NEXAFS); NO PHASE; SCANNING TUNNELING MICROSCOPY (STM); SELF ASSEMBLED MONOLAYERS (SAMS); SPECTROSCOPIC CHARACTERIZATIONS; TRANSITION METAL COMPLEXES; WELL-ORDERED MONOLAYERS; X RAY PHOTOELECTRON SPECTROSCOPY (XPS);

X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 45749127117     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la702836r     Document Type: Article

References (50)

1. Fujihara, M.; Rubinstein, J.; Rusling, J. F. In Encyclopedia of Electrochemistry; Bard, A. J., Stratmann, M., Eds.;Wiley-VCH: Weinheim, Germany, 2007; Vol. 10.
2. McKay, B. A.; Fryzuk, M. D. Chem. Rev. 2004, 104, 385.
3. Leigh, J. G.; Pickett, J. C. J.Chem. Soc., Dalton Trans. 1977, 1797.
4. Habeck, M. C.; Lehnen, N.; Näther, C.; Tuczek, F. Inorg. Chim. Acta 2002, 337C, 11. and refs cited therein.
5. Tao, T. Y.; Wu, Ch. Ch.; Eu, Y. J.; Lin, L. W. Langmuir 1997, 13, 4018.
6. Ishida, T.; Choi, N.; Mizutani, W.; Tokumoto, H.; Kojima, I.; Azehara, H.; Hokari, H.; Akiba, U.; Fujihira, M. Langmuir 1999, 15, 6799.
7. Jung, H. H.; Won, D. Y.; Shin, S.; Kim, K. Langmuir 1999, 15, 1147.
8. Baunach, T.; Kolb, M. D. Anal. Bioanal. Chem. 2002, 373, 743.
9. Sturrock, J. E.; Chen, Q.; Borchardt, H. P.; Richardson, V. N. J. Electron. Spec. 2004, 135, 127.
10. Noh, J.; Park, H.; Jeong, Y.; Kwon, S. Bull. Kor. Chem. Soc. 2006, 27, 403.
11. Szafranski, C. A.; Tanner, W.; Laibinis, P. E.; Garrell, R. L. Langmuir 1998, 14, 3570.
12. Moulder, J. F.; Stickle, W. E.; Sobol, P. E.; Bomben, K. D. Handbook of X-ray Photoelectron Spectroscopy; Perkin-Elmer: Eden Prairie, MN, 1992.
13. Frisch, M. J.; Trucks, G. W.; Schlegel, H. B.; Scuseria, G. E.; Robb, M. A.; Zakrzewski, V. G.; Montgomery, J. A., Jr.; Stratmann, R. E.; Burant, J. C.; Dapprich, S.; Millam, J. M.; Daniels, A. D.; Kudin, K. N.; Strain, M. C.; Farkas, O.; Tomasi, J.; Barone, V.; Cossi, M.; Cammi, R.; Mennucci, B.; Pomelli, C.; Adamo, C.; Clifford, S.; Ochterski, J.; Petersson, G. A.; Ayala, P. Y.; Cui, Q.; Morokuma, K.; Malick, D. K.; Rabuck, A. D.; Raghavachari, K.; Foresman, J. B.; Cioslowski, J.; Ortiz, J. V.; Stefanov, B. B.; Liu, G.; Liashenko, A.; Piskorz, P.; Komaromi, I.; Gomperts, R.; Martin, R. L.; Fox, D. J.; Keith, T.; Al-Laham, M. A.; Peng, C. Y.; Nanayakkara, A.; Gonzalez, C.; Challacombe, M.; Gill, P. M. W.; Johnson, B. G.; Chen, W.; Wong, M. W.; Andres, J. L.; Head-Gordon, M.; Replogle, E. S.; Pople, J. A. Gaussian 98; Gaussian Inc.: Pittsburgh, PA, 1998.
14. Staemmler, V. Theor. Chim. Acta 1977, 45, 89.
15. Wasilewski, J. Int. J. Quantum Chem. 1989, 36, 503.
16. (a) Meier, U.; Staemmler, V. Theor. Chim. Acta 1989, 76, 95.
17. (b) Fink, R.; Staemmler, V. Theor. Chim. Acta 1993, 87, 129.
18. Kolczewski, C.; Püttner, R.; Plashkevych, O.; Agren, H.; Staemmler, V.; Martins, M.; Snell, G.; Schlachter, S. A.; Sant'Anna, M.; Kaindl, G.; Pettersson, M. G. L. J. Chem. Phys. 2001, 115, 6426.
19. Reiss, S.; Krumm, H.; Niklewsi, A.; Staemmler, V.; Woll, Ch. J. Chem. Phys. 2002, 116, 7704.
20. Boys, F. S. Rev. Mod. Phys. 1960, 32, 296.
21. Foster, M. J.; Boys, F. S. Rev. Mod. Phys. 1960, 32, 300.
22. Kolczewski, Ch.; Staemmler, V. Unpublished work.
23. Rössler, N.; Staemmler, V. Phys. Chem. Chem. Phys. 2003, 5, 3580.
24. Hunt, W. J.; Goddard, W. A. Chem. Phys. Lett. 1969, 3, 414.
25. Huzinaga, S. J. Chem. Phys. 1965, 42, 1293.
26. Huzinaga, S. Approximate Atomic Functions;; University of Alberta: Alberta, Canada, 1971; Vols. I and II.
27. Ohta, T.; Fujikawa, T.; Kuroda, H. Bull. Chem. Soc. Jpn. 1975, 48, 2017.
28. Fuxen, C.; Azzam, W.; Arnold, R.; Witte, G.; Terfort, A.; Woll, Ch. Langmuir 2001, 17, 3689.
29. The mean free paths were calculated by using the Gries formula in the program electron inelastic mean-free path V. 1.1 provided by the National Institute of Standards and Technology, NIST.
30. Poirier, G. E.; Fitts, W. P.; White, J. M. Langmuir 2001, 17, 1176.
31. Azzam, W; Bashir, A; Terfort, A; Strunskus, T.; Wöll, Ch. Langmuir 2006, 22, 3647.
32. Edinger, K; Gölzhäuser, A.; Demota, K; Woll, Ch.; Grunze, M. Langmuir 1993, 9, 4.
33. Poirier, G. E. Langmuir 1997, 13, 2019.
34. Gorman, B. Ch.; He, Y.; Carrol, L. R. Langmuir 2001, 17, 5324.
35. Bucher, J. P.; Santesson, L.; Kern, K. Langmuir 1994, 10, 979.
36. Azzam, W; Cyganik, P; Witte, G; Buck, M; Wöll, Ch. Langmuir 2003, 19, 8262.
37. Dmitriev, A.; Spillmann, H.; Stepanow, S.; Strunskus, T.; Wöll, Ch.; Seitsonen, P. A.; Lingenfelder, M.; Lin, N.; Barth, V. J; Kern, K. Chem. Phys. Chem. 2006, 7, 2197.
38. Shaporenko, A.; Terfort, A.; Grunze, M.; Zharnikov, M. J. Electron Spectrosc Relat. Phenom. 2006, 157, 45.
39. Yang, W. Y.; Fan, J. L. Langmuir 2002, 18, 1157.
40. Whelan, M. C.; Smyth, R. M.; Barnes, J. C. Langmuir 1999, 15, 116.
41. Zharnikov, M.; Grunze, M. J. Phys.: Condens. Matter 2001, 13, 11333.
42. Rangan, S.; Gallet, J. J.; Boumel, F.; Kubsky, S.; Guen, L. K.; Dufour, G.; Rochet, F.; Sirotti, F.; Carniato, S.; Ilakovac, V. Phys. Rev. B 2005, 71, 165318.
43. Frey, S.; Shaporenko, A.; Zharnikov, M.; Harder, P.; Aliara, L. D. J. Phys. Chem. B 2003, 107, 7716.
44. Kang, J. F.; Ulman, A.; Liao, S.; Jordan, R.; Yang, G.; Liu, G. Langmuir 2001, 17, 95.
45. Yang, G.; Liu, G. J. Phys. Chem. B 2003, 104, 8746.
46. Cyganik, P.; Buck, M.; Azzam, W.; Wöll, Ch. J. Phys. Chem. B 2004, 108, 4989.
47. Käfer, D.; Bashir, A.; Witte, G. J. Phys. Chem. C. 2007, 111, 10546.
48. Leung, B. Y. T.; Schwartz, P.; Scoles, G.; Schreiber, F.; Ulman, A. Surf. Sci. 2000, 458, 34.
49. Rong, T. H.; Frey, S.; Yang, J. Y.; Zharnikov, M.; Buck, M.; Wühn, M.; Wöll, Ch.; Helmchen, G. Langmuir 2001, 17, 1582.
50. Arnold, R.; Azzam, W.; Terfort, A.; Wöll, Ch. Langmuir 2002, 18, 3980.