Surface-enhanced raman scattering substrates fabricated using electroless plating on polymer-templated nanostructures

Langmuir

Volumn 24, Issue 11, 2008, Pages 5862-5867

  Bantz, Kyle C ^a   Haynes, Christy L ^a  

^a University of Minnesota   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AMERICAN CHEMICAL SOCIETY (ACS); ANALYTE; ANALYTICAL SPECTROSCOPY; ANALYTICAL TECHNIQUES; AQUEOUS ENVIRONMENTS; ELECTROLESS; ELECTROLESS DEPOSITION (ELD); ENHANCEMENT FACTORS (EF); LABORATORY ENVIRONMENT; LOCALIZED SURFACE PLASMON RESONANCE (LSPR); MOLECULAR SIGNATURES; NANO PARTICLES; POLYMER SCAFFOLDS; RAMAN EXCITATION; SERS SUBSTRATE; SILVER FILMS; SPECIALIZED EQUIPMENT; SUBSTRATE DESIGN; SURFACE ENHANCED RAMAN SCATTERING (SARS); TEMPLATED;

ARCHITECTURAL DESIGN; CHEMICALS; ELECTROLESS PLATING; NANOSPHERES; NANOSTRUCTURED MATERIALS; NANOSTRUCTURES; PLATING; POLYMERS; PRECIOUS METALS; RAMAN SCATTERING; RAMAN SPECTROSCOPY; SCAFFOLDS; SCATTERING; SILVER; SURFACE PLASMON RESONANCE; SURFACE POTENTIAL; SURFACE PROPERTIES; SURFACES;

SUBSTRATES;

EID: 45749099014     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la800103b     Document Type: Article

References (28)

1. Jeanmaire, D. L.; Van Duyne, R. P. J. Electroanal. Chem. Interfacial Electrochem. 1977, 84, 1.
2. McCreery; L., R. Raman Spectroscopy for Chemical Analysis; Wiley-Interscience: New York, 2000.
3. Schatz, G.; Van Duyne, R. P. In Handbook of Vibrational Spectroscopy; Chalmers, J. M., Griffiths, P. R., Eds.; Wiley: New York City, 2002; p 759-774.
4. Campion, A.; Kambhampati, P. Chem. Soc. Rev. 1998, 27, 241-250.
5. Haynes, C. L.; Van Duyne, R. P. J. Phys. Chem. B 2003, 107, 7426-7433.
6. Kneipp, K.; Wang, Y.; Kneipp, H.; Perelman, L. T.; Itzkan, I.; Dasari, R. R.; Feld, M. S. Phys. Rev. Lett. 1997, 78, 1667.
7. Nie, S.; Emory, S. R. Science (Washington, D.C.) 1997, 275, 1102.
8. Jensen, T. R.; Malinsky, M. D.; Haynes, C. L.; Van Duyne, R. P. J. Phys. Chem. B 2000, 104, 10549-10556.
9. Lee, P. C.; Meisel, D. J. Phys. Chem. 1982, 86, 3391.
10. Haynes, C. L.; McFarland, A. D.; Van Duyne, R. P. Anal. Chem. 2005, 77, 338A-346A
11. Kim, W.-T.; Safonov, V. P.; Drachev, V. P.; Podolskiy, V. A.; Shalaev, V. M.; Armstrong, R. L. Top. Appl. Phys. 2002, 82, 149-167.
12. Bi, H.; Cai, W.; Zhang, L.; Martin, D.; Trager, F. Appl. Phys. Lett. 2002, 87, 5222-5224.
13. Freeman, R. G.; Grabar, K. C.; Allison, K. J.; Bright, R. M.; Davis, J. A.; Guthrie, A. P.; Hommer, M. B.; Jackson, M. A.; Smith, P. C.; et al. Science 1995, 267, 1629-31.
14. Baker, B. E.; Kline, N. J.; Treado, P. J.; Natan, M. J. J. Am. Chem. Soc. 1996, 118, 8721-8722.
15. Dick, L. A.; McFarland, A. D.; Haynes, C. L.; Van Duyne, R. P. J. Phys. Chem. B 2002, 106, 853-860.
16. Stropp, J.; Trachta, G.; Brehm, G.; Schneider, S. J. Raman Spectrosc. 2003, 34, 26-32.
17. Stuart, D. A.; Yonzon, C. R.; Zhang, X.; Lyandres, O.; Shah, N. C.; Glucksberg, M. R.; Walsh, J. T.; Van Duyne, R. P. Anal. Chem. 2005, 77, 4013-4019.
18. Zhang, X.; Zhao, J.; Whitney, A. V.; Elam, J. W.; Van Duyne, R. P. J. Am. Chem. Soc. 2006, 128, 10304-10309.
19. Hulteen, J. C.; Young, M. A.; Van Duyne, R. P. Langmuir 2006, 22, 10354-10364.
20. Whitney, A. V.; Casadio, F.; Van Duyne, R. P. Appl. Spectrosc. 2007, 67, 994-1000.
21. Whelan, C. M.; Smyth, M. R.; Barnes, C. J. Langmuir 1999, 75, 116-126.
22. Wan, L. J.; Terashima, M.; Noda, H.; Osawa, M. J. Phys. Chem. B 2000, 104, 3563-3569.
23. Le Ru, E. C.; Blackie, E.; Meyer, M.; Etchegoin, P. G. J. Phys. Chem. C 2007, 111, 13794-13803.
24. Park, H. K.; Yoon, J. K.; Kim, K. Langmuir 2006, 22, 1626-1629.
25. Liu, W. H.; Yu, T. L.; Lin, H. L. Polymer 2007, 48, 4152-4165.
26. CRC Handbook of Chemistry and Physics, 77th ed.; CRC Press: Boca Raton, FL, 2000.
27. Ma, F.; Lennox, R. B. Langmuir 2000, 16, 6188-6190.
28. Stranick, S. J.; Parikh, A. N.; Tao, Y. T.; Allara, D. L.; Weiss, P. S. J. Phys. Chem. 1994, 98, 7636-7646.