Influence of nanotopography on phospholipid bilayer formation on silicon dioxide

Journal of Physical Chemistry B

Volumn 112, Issue 16, 2008, Pages 5175-5181

  Pfeiffer, Indriati ^a,c   Seantier, Bastien ^a   Petronis, Sarunas ^a   Sutherland, Duncan ^b   Kasemo, Bengt ^a   Zäch, Michael ^a  

^a CHALMERS UNIVERSITY OF TECHNOLOGY   (Sweden)

^b AARHUS UNIVERSITY   (Denmark)

^c MAX PLANCK INSTITUTE FOR POLYMER RESEARCH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ADSORPTION; LIPIDS; SILICA; SILICON COMPOUNDS; SULFUR COMPOUNDS;

LIPID VESICLES; NANO TOPOGRAPHY; NANOSCALE TOPOGRAPHY; PHOSPHOCHOLINE; PHOSPHOLIPID BILAYER; SILICON DIOXIDES;

PHOSPHOLIPIDS;

NANOMATERIAL; PHOSPHOLIPID; SILICON DIOXIDE;

ARTICLE; ATOMIC FORCE MICROSCOPY; CHEMISTRY; CRYSTALLIZATION; LIPID BILAYER; SURFACE PROPERTY; ULTRASTRUCTURE;

CRYSTALLIZATION; LIPID BILAYERS; MICROSCOPY, ATOMIC FORCE; NANOSTRUCTURES; PHOSPHOLIPIDS; SILICON DIOXIDE; SURFACE PROPERTIES;

EID: 45549109257     PISSN: 15206106     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp710614m     Document Type: Article

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