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Volumn 6940, Issue , 2008, Pages

A high-speed, MWIR reference source for FPA non-uniformity correction using negative luminescence

Author keywords

MCT; Negative luminescence; Non uniformity correction

Indexed keywords

COMPUTER NETWORKS; MERCURY (METAL); MICROFLUIDICS; TECHNOLOGY;

EID: 45549096665     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.786617     Document Type: Conference Paper
Times cited : (2)

References (13)
  • 1
    • 45549097306 scopus 로고    scopus 로고
    • R.K. McEwen, M. Lupton, M. Lawrence, P. Knowles, M. Wilson, P.N.J. Dennis, N.T. Gordon, D.J. Lees, J.F. Parsons, Proceedings of SPIE 6542, Infrared Technology and Applications XXXIII, B.F. Andresen, G.F. Fulop, P.R. Norton, Editors, 654214 (2007).
    • R.K. McEwen, M. Lupton, M. Lawrence, P. Knowles, M. Wilson, P.N.J. Dennis, N.T. Gordon, D.J. Lees, J.F. Parsons, Proceedings of SPIE Vol. 6542, Infrared Technology and Applications XXXIII, B.F. Andresen, G.F. Fulop, P.R. Norton, Editors, 654214 (2007).


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.