Quasi-2D polymer objects from patterned, crosslinked polymer brushes

Advanced Materials

Volumn 16, Issue 15 SPEC. ISS., 2004, Pages 1327-1331

  Edmondson, Steve ^a   Huck, Wilhelm T S ^a  

^a UNIVERSITY OF CAMBRIDGE   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CROSSLINKING; ELECTRODES; ELECTROLYSIS; FLUORESCENCE; FOURIER TRANSFORM INFRARED SPECTROSCOPY; LIPIDS; MONOLAYERS; POLYMERIZATION; SILICON; SUBSTRATES; SURFACE TOPOGRAPHY; SYNTHESIS (CHEMICAL); THICKNESS CONTROL; THIN FILMS;

ATOM-TRANSFER RADICAL POLYMERIZATION (ATRP); POLY(GLYCIDYL METHACRYLATE) (PGMA); POLYMER BRUSHES; SELF-ASSEMBLED MONOLAYERS (SAM);

POLYMERS;

EID: 4544381222     PISSN: 09359648     EISSN: None     Source Type: Journal    
DOI: 10.1002/adma.200400761     Document Type: Article

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