XPS and SSIMS studies of Pd/SnOx system: Reduction and oxidation in hydrogen containing air

Surface Science

Volumn 566-568, Issue 1-3 PART 2, 2004, Pages 1118-1123

  Moroseac, M ^a   Skala T ^a   Veltruska K ^a   Matolin V ^a   Matolinova I ^a  

^a CHARLES UNIVERSITY   (Czech Republic)

Author keywords

Metal semiconductor interfaces; Palladium; Secondary ion mass spectroscopy; Tin oxides; X ray photoelectron spectroscopy

Indexed keywords

HEAT TREATMENT; HYDROGEN; MASS SPECTROMETRY; OXIDATION; REDOX REACTIONS; STOICHIOMETRY; TIN COMPOUNDS; X RAY PHOTOELECTRON SPECTROSCOPY;

GAS DETECTION; METAL-SEMICONDUCTOR INTERFACES; SECONDARY ION MASS SPECTROSCOPY; TIN OXIDES;

PALLADIUM COMPOUNDS;

EID: 4544381005     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2004.06.068     Document Type: Article

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