XPS analysis of palladium oxide layers and particles

Surface Science

Volumn 350, Issue 1-3, 1996, Pages 21-31

  Voogt, E H ^a   Mens, A J M ^a   Gijzeman, O L J ^a   Geus, J W ^a  

^a UTRECHT UNIVERSITY   (Netherlands)

Author keywords

Atomic force microscopy; Clusters; Oxidation; Palladium; Sintering; X ray photoelectron spectroscopy

Indexed keywords

ATOMIC FORCE MICROSCOPY; CALCULATIONS; GROWTH (MATERIALS); METAL FOIL; OXIDATION; PARTICLE SIZE ANALYSIS; PARTICLES (PARTICULATE MATTER); SINTERING; SURFACE MEASUREMENT; THICKNESS MEASUREMENT; X RAY PHOTOELECTRON SPECTROSCOPY;

CLUSTERS; METALLIC CORE; OXIDIC SKIN; PALLADIUM FOIL; PALLADIUM OXIDE;

PALLADIUM COMPOUNDS;

EID: 0030129886     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/0039-6028(96)01028-X     Document Type: Article

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