In situ investigations into chemical processes by electron-energy-resolved X-ray absorption spectroscopy

Angewandte Chemie - International Edition

Volumn 43, Issue 28, 2004, Pages 3691-3695

  Vollmer, Antje ^a   Lipp, John D ^b   Weiss, Helmut ^b   O'Malley, Rachel ^a   Rayment, Trevor ^a  

^a UNIVERSITY OF CAMBRIDGE   (United Kingdom)

^b OTTO VON GUERICKE UNIVERSITY   (Germany)

Author keywords

EXAFS spectroscopy; Heterogeneous catalysis; Surface analysis; Surface chemistry; X ray absorption spectroscopy

Indexed keywords

CHEMICAL REACTIONS; ELECTROCHEMISTRY; IN SITU PROCESSING; MICROSTRIP DEVICES; SPECTROSCOPIC ANALYSIS;

ENERGY-RESOLVED ELECTRON DETECTION; GAS MICROSTRIP DETECTORS; X-RAY ABSORPTION SPECTROSCOPY;

ELECTRON ENERGY ANALYZERS;

ABSORPTION SPECTROSCOPY; ARTICLE; CHEMICAL REACTION; ELECTROCHEMISTRY; ELECTRON ENERGY LOSS SPECTROSCOPY; GAS; REACTION ANALYSIS; ROENTGEN SPECTROSCOPY; SENSITIVITY ANALYSIS;

EID: 4544344310     PISSN: 14337851     EISSN: None     Source Type: Journal    
DOI: 10.1002/anie.200353235     Document Type: Article

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14. Details of experimental procedures are provided as Supporting Information.
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