Towards a 'universal curve' for total electron-yield XAS

Solid State Communications

Volumn 98, Issue 5, 1996, Pages 405-409

  Schroeder, Sven L M ^a  

^a UNIVERSITY OF CAMBRIDGE   (United Kingdom)

Author keywords

A. surfaces and interfaces; A. thin films; C. EXAFS; E. synchrotron radiation; E. X ray and ray spectroscopies; NEXAFS; SEXAFS

Indexed keywords

ABSORPTION SPECTROSCOPY; CALCULATIONS; COMPUTER SIMULATION; ELECTRONS; INTERFACES (MATERIALS); MONTE CARLO METHODS; SURFACES; SYNCHROTRON RADIATION; THIN FILMS; X RAY SPECTROSCOPY;

AUGER ELECTRON; DEPTH DISTRIBUTION FUNCTIONS; GAMMA RAY SPECTROSCOPY; TOTAL ELECTRON YIELD; X RAY ABSORPTION SPECTROSCOPY;

AUGER ELECTRON SPECTROSCOPY;

EID: 0030150332     PISSN: 00381098     EISSN: None     Source Type: Journal    
DOI: 10.1016/0038-1098(96)00035-X     Document Type: Article

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