Application of high energy-resolution Silicon Drift Detectors (SDD) for quantitative light element analysis

Microscopy and Microanalysis

Volumn 9, Issue SUPPL. 2, 2003, Pages 120-121

  Terborg, Ralf ^a   Rohde, Martin ^a  

^a RONTEC GmbH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0041923691     PISSN: 14319276     EISSN: None     Source Type: Journal    
DOI: 10.1017/s1431927603440087     Document Type: Conference Paper

References (3)

1. R. Hartmann et al., Metrologia 32 (1996) 491
2. R. Hartmann et al., Nucl. Instr. and Meth. A 377 (1996) 191
3. F. Scholze, M. Procop, X-ray Spectrom. 30 (2001) 69