High resolution x-ray elemental mapping of nanoparticles in the STEM

Microscopy and Microanalysis

Volumn 10, Issue SUPPL. 2, 2004, Pages 468-469

  Watanabe, M ^a   Burrows, A ^a   Herzing, A A ^a   Kiely, C J ^a   Williams, D B ^a   Hutchings, G ^b   Liz Marzin, L M ^c  

^a Lehigh University   (United States)

^b CARDIFF UNIVERSITY   (United Kingdom)

^c UNIVERSITY OF VIGO   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 4544258394     PISSN: 14319276     EISSN: None     Source Type: Journal    
DOI: 10.1017/S1431927604886665     Document Type: Conference Paper

References (3)

1. P.G. Kotula et al., Microscopy & Microanalysis, 9, (2003), 1.
2. B. Rodriguez-Gonzalez et al. Faraday Discuss., 125, (2004), 133.
3. This research was supported by Bechtel Bettis Laboratories and NSF DMR 99-72670.