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Volumn 45, Issue 7, 2004, Pages 2117-2121

High resolution microscopy study for [001] symmetric tilt boundary with a tilt angle of 66° in rutile-type TiO2 bicrystal

(6) Ohno, Takahiro a Ii, Seiichiro b Shibata, Naoya b Matsunaga, Katsuyuki b Ikuhara, Yuichi b Yamamoto, Takahisa b

a MURATA MANUFACTURING CO LTD (Japan)

b UNIVERSITY OF TOKYO (Japan)

Author keywords

Bicrystal; Displacement shift complete dislocation; Grain boundary structure; High resolution transmission electron microscopy study; TiO2

Indexed keywords

CRYSTAL ORIENTATION; CRYSTAL STRUCTURE; DISLOCATIONS (CRYSTALS); ELECTRON BEAMS; GRAIN BOUNDARIES; MICROSCOPIC EXAMINATION; SINGLE CRYSTALS; STRUCTURAL ANALYSIS; TRANSMISSION ELECTRON MICROSCOPY;

BICRYSTAL; DISPLACEMENT SHIFT COMPLETE DISLOCATION; GRAIN BOUNDARY STRUCTURE; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY STUDY;

TITANIUM DIOXIDE;

EID: 4544247427 PISSN: 13459678 EISSN: None Source Type: Journal
DOI: 10.2320/matertrans.45.2117 Document Type: Conference Paper

Times cited : (11)

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