Vectorial, high-numerical-aperture study of phase-contrast microscopes

Journal of the Optical Society of America A: Optics and Image Science, and Vision

Volumn 21, Issue 9, 2004, Pages 1714-1723

  Munro, Peter R T ^a   Török, Peter ^a  

^a IMPERIAL COLLEGE LONDON   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

DETECTORS; IMAGE PROCESSING; IMAGE QUALITY; IMAGING SYSTEMS; LIGHT SCATTERING; LIGHT TRANSMISSION; MATHEMATICAL MODELS; MICROSCOPES; NUMERICAL ANALYSIS;

DIRECTLY TRANSMITTED LIGHT; HIGH NUMERICAL APERTURE STUDY; INTERFERENCE MICROSCOPES; LATERALLY SCANNED IMAGES; PHASE CONTRAST MICROSCOPES;

OPTICAL MICROSCOPY;

EID: 4544225157     PISSN: 10847529     EISSN: None     Source Type: Journal    
DOI: 10.1364/JOSAA.21.001714     Document Type: Article

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