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Volumn , Issue , 2007, Pages 658-662

Technology chain for production of low-cost high aspect ratio optical structures

Author keywords

[No Author keywords available]

Indexed keywords

CHARACTERIZATION TESTS; HIGH ASPECT RATIO; HOT-EMBOSSING; OPTICAL STRUCTURES; REPLICATION PROCESS; SIDE WALLS;

EID: 45149125128     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1007/978-3-540-73956-2_129     Document Type: Conference Paper
Times cited : (3)

References (6)
  • 1
    • 33746756015 scopus 로고    scopus 로고
    • Design, modeling and prototyping of a microinterferometric tomography system for optical fiber inspection
    • R. Krajewski, et al.,Design, modeling and prototyping of a Microinterferometric Tomography System for optical fiber inspection", Proc.SPIE vol.6188, pp.138-148, 2006
    • (2006) Proc. SPIE , vol.6188 , pp. 138-148
    • Krajewski, R.1
  • 2
    • 33846202935 scopus 로고    scopus 로고
    • M(O)EMS-based integrated micro-interferometric system
    • J. Krel, et al. "M(O)EMS-based integrated micro-interferometric system", Proc. SPIE, vol. 6348-22, 2006
    • (2006) Proc. SPIE , vol.6348 , Issue.22
    • Krel, J.1
  • 3
    • 28544442134 scopus 로고    scopus 로고
    • Low-cost microinterferomtric tomograpy system for 3D refraction index distribution Measurements in optical fiber splices
    • R. Krajewski et al. "Low-cost microinterferomtric tomograpy system for 3D refraction index distribution Measurements in optical fiber splices", Proc. SPIE vol. 5855, pp.347-351, 2005
    • (2005) Proc. SPIE , vol.5855 , pp. 347-351
    • Krajewski, R.1
  • 4
    • 2142665760 scopus 로고    scopus 로고
    • Hot embossing-A flexible and successful replication technology for polymer MEMS
    • M. Heckele, "Hot embossing-A flexible and successful replication technology for polymer MEMS", Proc. SPIE Vol. 5345, pp. 108-117, 2004
    • (2004) Proc. SPIE , vol.5345 , pp. 108-117
    • Heckele, M.1
  • 6
    • 29244465901 scopus 로고    scopus 로고
    • Multifunctional interferometric platform for static and dynamic MEMS measurement
    • J. Kacperski, et al. "Multifunctional interferometric platform for static and dynamic MEMS measurement", Proc. SPIE vol. 5878, pp. 64-73, 2005
    • (2005) Proc. SPIE , vol.5878 , pp. 64-73
    • Kacperski, J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.