High frequency measurements on an AlN/GaN-based intersubband detector at 1550 and 780 nm

Applied Physics Letters

Volumn 92, Issue 23, 2008, Pages

  Hofstetter, D ^a   Baumann, E ^a   Giorgetta, F R ^a   Dawlaty, J ^b   George, P A ^b   Rana, F ^b   Guillot, F ^c   Monroy, E ^c  

^a UNIVERSITY OF NEUCHÂTEL   (Switzerland)

^b Cornell University   (United States)

^c CEA GRENOBLE   (France)

Author keywords

[No Author keywords available]

Indexed keywords

DETECTORS; ELECTRIC FREQUENCY MEASUREMENT; LASERS; MEASUREMENTS; PULSED LASER DEPOSITION;

(140.3500) LASERS; AMERICAN INSTITUTE OF PHYSICS (AIP); HIGH FREQUENCY (HF) MEASUREMENTS; HIGH-FREQUENCY (HF); HIGHER ORDER; INTER SUBBAND; INTERSUBBAND TRANSITION (ISB T); INTRINSIC PROPERTIES; LASER WAVELENGTHS; MODE-LOCKED; SOLID STATES;

SOLID STATE LASERS;

EID: 45149097986     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2939433     Document Type: Article

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