Control of film morphology and its effects on subthreshold characteristics in dibenzotetrathiafulvalene organic thin-film transistors

Applied Physics Letters

Volumn 92, Issue 23, 2008, Pages

  Yamada, T ^a   Hasegawa, T ^a   Hiraoka, M ^a   Matsui, H ^a,b   Tokura, Y ^a,b   Saito, G ^c  

^a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

^b UNIVERSITY OF TOKYO   (Japan)

^c KYOTO UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL SENSORS; COUPLING AGENTS; MORPHOLOGY; PHOTOACOUSTIC EFFECT; SEMICONDUCTING ORGANIC COMPOUNDS; SILANES; SILICA; SILICON; TECHNOLOGY; THIN FILM DEVICES; TRANSISTORS;

(1 1 0) SURFACE; DIELECTRIC SUBSTRATES; FIELD-EFFECT MOBILITY (FEM); FILM MORPHOLOGY; GRAIN SIZES; HEXAMETHYL DISILAZANE (HMDS); INTERFACE ENGINEERING; ORGANIC THIN FILM TRANSISTORS (O TFT); POLY CRYSTALLINE; SILANE COUPLING AGENT (SCA); SILICON DIOXIDES; SUBTHRESHOLD CHARACTERISTICS;

THIN FILM TRANSISTORS;

EID: 45149094036     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2940593     Document Type: Article

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