Inhomogeneous creep fields in PLZT: An experimental study

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 6929, Issue , 2008, Pages

  Liu, Q D ^a   Huber, J E ^b  

^a UNIVERSITY OF CAMBRIDGE   (United Kingdom)

^b UNIVERSITY OF OXFORD   (United Kingdom)

Author keywords

Birefringence; Crack; Creep; Electrode; Ferroelectric; Hole; PLZT

Indexed keywords

BIREFRINGENCE; BOUNDARY CONDITIONS; BOUNDARY VALUE PROBLEMS; COMPOSITE MATERIALS; COMPOSITE MICROMECHANICS; CRACK TIPS; ELECTRIC FIELD EFFECTS; ELECTRIC FIELD MEASUREMENT; ELECTRIC FIELDS; ELECTROACUPUNCTURE; ELECTROMAGNETIC FIELD THEORY; ELECTROMAGNETIC FIELDS; ELECTROMAGNETISM; HOLE CONCENTRATION; MAGNETISM; MECHANICS; METALLIZING; OPTICAL PROPERTIES; PIGMENTS; STRAIN MEASUREMENT;

(I ,J) CONDITIONS; (P ,P ,T) MEASUREMENTS; BIREFRINGENCE IMAGING; COERCIVE FIELDS; CONCENTRATION (COMPOSITION); CONSTANT VOLTAGE (CV); CRACK TIP FIELDS; ELECTRIC FIELD STRENGTH (EFS); ELECTRODE TIPS; EVOLUTION (CO); EXPERIMENTAL STUDIES; INTENSE (CO); NON-UNIFORM FIELDS; REMANENT STRAIN; STRAIN FIELDS; SURFACE ELECTRODES; TIME PERIODS;

STRENGTH OF MATERIALS;

EID: 44949211680     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.774385     Document Type: Conference Paper

References (7)

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