Images of absolute retardance L·Δn, using the rotating polariser method

Journal of Microscopy

Volumn 198, Issue 1, 2000, Pages 1-9

  Geday, M A ^a   Kaminsky, W ^a   Lewis, J G ^a   Glazer, A M ^a  

^a UNIVERSITY OF OXFORD   (United Kingdom)

Author keywords

Absolute double refraction; Birefringence; Fringe order; Indicatrix; Interferometry; Light microscopy; Polarized light

Indexed keywords

INTERFEROMETRY; LIGHT POLARIZATION; OPTICAL INSTRUMENTS; REFRACTION;

ABSOLUTE DOUBLE REFRACTION; ABSOLUTE PHASE; ABSOLUTE VALUES; FRINGE ORDERS; INDICATRIX; MODULATION TECHNIQUES; OPTICAL BIREFRINGENCE; OPTICAL-; POLARISERS; RETARDANCE;

BIREFRINGENCE;

ALGORITHM; ARTICLE; BIREFRINGENCE; IMAGING; MICROSCOPY; POLARIZATION; PRIORITY JOURNAL;

EID: 0034003440     PISSN: 00222720     EISSN: None     Source Type: Journal    
DOI: 10.1046/j.1365-2818.2000.00687.x     Document Type: Article

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