Terahertz scattering from a Rough Granular Surface

IEEE Antennas and Propagation Society, AP-S International Symposium (Digest)

Volumn , Issue , 2007, Pages 4929-4932

  Zurk, Lisa M ^a   Orlowski, Brian ^a   Sundberg, Garth ^a   Zhou, Zhen ^b   Chen, Antao ^b  

^a Department of Electrical and Computer Engineering   (United States)

^b UNIVERSITY OF WASHINGTON   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 44949206792     PISSN: 15223965     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/APS.2007.4396650     Document Type: Conference Paper

References (5)

1. M. C. Kemp, P. F. Taday, B. E. Cole, J. A. Cluff, A. J. Fitzgerald, and W. R. Tribe, Security applications of terahertz technology, Proc. SPIE 5070 (2003).
2. K. Yamamoto, M. Yamaguchi, F. Miyamaru, M. Tani, M. Hangyo, T. Ikeda, A. Masushita, K. Koide M. Tatsuno, and Y. Minami, Noninvasive inspection of C-4 explosive in mails by terahertz time-domain spectroscopy, Japan. J. Appl. Phys. 43 (2004).
3. L.M. Zurk, B. Orlowski, G. Sundberg, D.P Winebrenner, E.I Thorsos, A. Chen, Electromagnetic Scattering Calculations for Terahertz Sensing, Proc. of SPIE 6472 (2007)
4. Yamac Dikmelik, James B. Spicer, Michael J. Fitch, and Robert Osiander, Effects of surface roughness on reflection spectra obtained by terahertz time-domain spectroscopy, Optics Letters V31 (2006)
5. P.C. Pedersen and A. Grebe, Measurement of Rough Surface Scattering using Time Delay Spectroscopy, Proc. of IEEE Ultrasonics Symp. V1 (1997)