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Volumn 1, Issue , 1997, Pages 827-831
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Measurement of rough surface scattering using time delay spectrometry
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Author keywords
[No Author keywords available]
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Indexed keywords
ACOUSTIC WAVE BACKSCATTERING;
ROUGHNESS MEASUREMENT;
SIGNAL TO NOISE RATIO;
SPECTROMETRY;
SPECTRUM ANALYZERS;
SURFACE ROUGHNESS;
ULTRASONIC SCATTERING;
ULTRASONIC TRANSDUCERS;
TIME DELAY SPECTROMETRY;
ULTRASONIC MEASUREMENT;
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EID: 0031379339
PISSN: 10510117
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
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Times cited : (4)
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References (10)
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