Nanoparticle formation in Au thin films by electron-beam-induced dewetting

Nanotechnology

Volumn 19, Issue 25, 2008, Pages

  Kojima, Yasuhiko ^a   Kato, Takahisa ^b  

^a Elionix Inc   (Japan)

^b UNIVERSITY OF TOKYO   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGED PARTICLES; ELECTRONS; GOLD ALLOYS; LIQUID PHASE EPITAXY; NANOPARTICLES; NANOSTRUCTURED MATERIALS; NANOSTRUCTURES; SILICON COMPOUNDS; THICK FILMS; THIN FILMS;

AU THIN FILMS; AU(111) FILMS; DE-WETTING; ELECTRON-BEAM; NANOPARTICLE FORMATION;

GOLD;

GOLD; NANOPARTICLE; SILICON; SILICON DIOXIDE;

ARTICLE; ELECTRON BEAM; FILM; PRIORITY JOURNAL; SCANNING ELECTRON MICROSCOPY; SURFACE PROPERTY; TECHNIQUE; THICKNESS;

EID: 44949166484     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/19/25/255605     Document Type: Article

References (27)

1. Klemmer T J, Liu C, Shukla N, Wu X W, Weller D, Tanase M, Laughlin D E and Soffa W A 2003 J. Magn. Magn. Mater. 266 79
2. Maier S A, Kik P G, Atwater H A, Meltzer S, Harel E, Koel B E and Requicha A G 2003 Nat. Mater. 2 229
3. Mitsui K, Handa Y and Kajikawa K 2004 Appl. Phys. Lett. 85 4231
4. Vrij A 1966 Discuss. Faraday Soc. 42 23
5. Reiter G 1992 Phys. Rev. Lett. 68 75
6. Buschbaum P M, Vanhoorne P, Scheumann V and Stamm M 1997 Europhys. Lett. 40 655
7. Xie R, Karim A, Douglas J F, Han C C and Weiss R A 1998 Phys. Rev. Lett. 81 1251
8. Seemann R, Herminghaus S and Jacobs K 2001 J. Phys.: Condens. Matter 13 4925
9. Seemann R, Herminghaus S and Jacobs K 2001 Phys. Rev. Lett. 86 5534
10. Wensink K D F and Jerome B 2002 Langmuir 18 413
11. Sharma A and Verma R 2004 Langmuir 20 10337
12. Seemann R, Herminghaus S, Neto C, Schlagowski S, Podzimek D, Konrad R, Mantz H and Jacobs K 2005 J. Phys.: Condens. Matter 17 S267
13. Bischof J, Scherer D, Herminghaus S and Leiderer P 1996 Phys. Rev. Lett. 77 1536
14. Herminghaus S, Jacobs K, Mecke K, Bischof J, Fery A, Ibn-Elhaj M and Schlagowski S 1998 Science 282 916
15. Henley S J, Carey J D and Silva S R P 2005 Phys. Rev. B 72 195408
16. Favazza C, Trice J, Krishna H, Kalyanaraman R and Sureshkumar R 2006 Appl. Phys. Lett. 88 153118
17. Favazza C, Kalyanaraman R and Sureshkumar R 2006 Nanotechnology 17 4229
18. Hu X, Cahill D G and Averback R S 2003 J. Appl. Phys. 93 165
19. Bolse T, Paulus H and Bolse W 2006 Nucl. Instrum. Methods B 245 264
20. Aizawa M and Buriak J M 2007 Chem. Mater. 19 5090
21. Rosen M J 1989 Surfactants and Interfacial Phenomena 2nd edn (New York: Wiley)
22. Zhao K, Averback R S and David G C 2006 Appl. Phys. Lett. 89 53103
23. Giermann A L and Thompson C V 2005 Appl. Phys. Lett. 86 121903
24. Mullins W W 1957 J. Appl. Phys. 28 333
25. Sangiorgi R, Muolo M L, Chatain D and Eustathopoulous N 1988 J. Am. Ceram. Soc. 71 742
26. Sutter E and Sutter P 2006 Nanotechnology 17 3724
27. Egry I, Lohoefer G and Jacobs G 1995 Phys. Rev. Lett. 27 4043