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Volumn 166, Issue , 2007, Pages 95-133

Electrical metrology

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Indexed keywords


EID: 44949155369     PISSN: 0074784X     EISSN: 18798195     Source Type: Conference Proceeding    
DOI: 10.3254/978-1-58603-784-0-95     Document Type: Conference Paper
Times cited : (1)

References (19)
  • 1
    • 0003785801 scopus 로고    scopus 로고
    • 8th edition (International Bureau of Weights and Measures)
    • The International System of Units, 8th edition (International Bureau of Weights and Measures) 2006.
    • (2006) The International System of Units
  • 13
    • 0037754169 scopus 로고    scopus 로고
    • Recent advances in metrology and fundamental constants
    • Course CXLVI, edited by Quinn T. J., Leschiutta S. and Tavella P. (IOS Press, Amsterdam)
    • KELLER M. W., in Recent Advances in Metrology and Fundamental Constants, Proceedings of the International School of Physics "Enrico Fermi,", Course CXLVI, edited by Quinn T. J., Leschiutta S. and Tavella P. (IOS Press, Amsterdam) 2001, p. 291.
    • (2001) Proceedings of the International School of Physics "Enrico Fermi," , pp. 291
    • Keller, M.W.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.