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Volumn 166, Issue , 2007, Pages 95-133
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Electrical metrology
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 44949155369
PISSN: 0074784X
EISSN: 18798195
Source Type: Conference Proceeding
DOI: 10.3254/978-1-58603-784-0-95 Document Type: Conference Paper |
Times cited : (1)
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References (19)
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