Silicon-carbide-based extreme environment temperature sensor using wavelength-tuned signal processing

Optics Letters

Volumn 33, Issue 10, 2008, Pages 1129-1131

  Riza, Nabeel A ^a   Sheikh, Mumtaz ^a  

^a UNIVERSITY OF CENTRAL FLORIDA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

PROCESSING; REFRACTIVE INDEX; SILICON CARBIDE; SILICON WAFERS; SINGLE CRYSTALS; TEMPERATURE MEASUREMENT; TEMPERATURE SENSORS; THERMAL EXPANSION;

EXTREME ENVIRONMENT; MATERIALS PROCESSING; REFRACTIVE INDEX CHANGES; SELLMEIER EQUATION; SINGLE CRYSTAL SILICON; TEMPERATURE-DEPENDENT REFRACTIVE INDICES; WAVELENGTH CHANGE; WIDE TEMPERATURE RANGES;

SIGNAL PROCESSING;

EID: 44949092542     PISSN: 01469592     EISSN: None     Source Type: Journal    
DOI: 10.1364/OL.33.001129     Document Type: Article

References (9)

1. R. S. Okojie, A. A. Ned, and A. D. Kurtz, in Proceedings of the IEEE International Conference on Solid-State Sensors and Actuators (IEEE, 1997), p. 1407.
2. D. Grobnic, C. W. Smelser, S. J. Mihailov, and R. B. Walker, in Proceedings of the European Conference on Optical Communications (ECOC) (ECOC, 2004), Vol. 2, p. 130.
3. D. Grobnic, S. J. Mihailov, C. W. Smelser, and H. Ding, IEEE Photon. Technol. Lett. 16, 2505 (2004).
4. Y. Zhang, G. R. Pickrell, B. Qi, A. S.-Jazi, and A. Wang, Opt. Eng. 43, 157 (2004).
5. G. Beheim, Electron. Lett. 22, 238 (1986).
6. L. Cheng, A. J. Steckl, and J. Scofield, IEEE Trans. Electron Devices 50, 2159 (2003).
7. N. A. Riza, M. A. Arain, and F. Perez, IEEE Sens. J. 6, 672 (2006).
8. W. Martienssen and H. Warlimont, eds., Handbook of Condensed Matter and Materials Data, Vol. XVII (Springer, 2005).
9. N. A. Riza, M. A. Arain, and F. Perez, J. Appl. Phys. 98, 103512 (2005).